HR-TEM, JEM 2100

The High Resolution Transmission Electron Microscope, JEM 2100, JEOL is being used for 2D nano scale imaging of various samples from the field of material science. 

Specifications
  • Accelerating Voltage 200kV
  • Gatan USC 4000 4x4k camera
  • Specimen tilt +/-70°
  • Double Tilt (+/- 45°) Vacuum Transfer Holder
  • Detectors: BF/DF STEM, EDS, 3D Tomography
  • Resolution  0.23 nm (point to point),  0.14 nm (lattice)
High Resolution Scanning Electron Microscope

 

 

 

Last Updated Date : 30/12/2021