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High Resolution Transmission Electron Microscope

The High Resolution Transmission Electron Microscope, JEM 2100, JEOL is being used for 2D nano scale imaging of various samples from the field of material science. 

Specifications
  • Accelerating Voltage 200kV
  • Gatan USC 4000 4x4k camera
  • Specimen tilt +/-70°
  • Double Tilt (+/- 45°) Vacuum Transfer Holder
  • Detectors: BF/DF STEM, EDS, 3D Tomography
  • Resolution  0.23 nm (point to point),  0.14 nm (lattice)
High Resolution Scanning Electron Microscope

 

 

 

Last Updated Date : 29/06/2021