HR-TEM, JEM 2100
The High Resolution Transmission Electron Microscope, JEM 2100, JEOL is being used for 2D nano scale imaging of various samples from the field of material science.
Specifications
- Accelerating Voltage 200kV
- Gatan USC 4000 4x4k camera
- Specimen tilt +/-70°
- Double Tilt (+/- 45°) Vacuum Transfer Holder
- Detectors: BF/DF STEM, EDS, 3D Tomography
- Resolution 0.23 nm (point to point), 0.14 nm (lattice)
Last Updated Date : 28/03/2023
