Advanced Electron Microscopy Analysis

SEM, HR-SEM (Magellan), HR-SEM (Sigma), HR-TEM, CRYO-TEM, FIB

BINA’s Electron Microscopy Facility offers high-resolution imaging and analysis for research in materials science, nanotechnology, and life sciences. Operated by our expert team, the facility supports detailed structural and compositional studies at the nanoscale.

Open to both academic and industrial users—including startups and product developers, BINA provides advanced tools for R&D, quality control, and innovation.

An ideal complement to any Fabrication process, our services help you validate, troubleshoot, and optimize with confidence.

Contact us today to learn more - gr.biunano@biu.ac.il

Focused Ion Beam (FIB)
High-Resolution SEM (HR-SEM Magellan)
High-Resolution SEM (HR-SEM Sigma)
High-Resolution TEM (HR-TEM)
SEM (SEM)

Last Updated Date : 26/06/2025

SEM, HR-SEM (Magellan), HR-SEM (Sigma), HR-TEM, CRYO-TEM, FIB

Focused Ion Beam (FIB)

High-Resolution SEM (HR-SEM Magellan)

High-Resolution SEM (HR-SEM Sigma)

High-Resolution TEM (HR-TEM)

SEM (SEM)