Dimension Icon, Bruker

Specifications:

Parameter Scanner: X-Y scan range 30 μm- 90μm x 90μm

Parameter Scanner: Z range: 10 μm typical in imaging and force curve modes

Controller: NanoScopeV

Max sample size:

• 210 mm vacuum chuck for samples, 15 mm thick.

• Motorized position stage: 180 mm × 150 mm inspectable area

   

• Optical microscope: 5-megapixel digital camera 180 μm to 1465μm viewing area; Digital zoom and motorized focus
• Found in the glovebox
• Contact and Tapping modes
• Magnetic Force Microscopy
• Electrostatic Force Microscopy (EFM) and Surface potential measurements (Kelvin Probe AFM)
• Scanning Spreading Resistance Microscopy (SSRM)
• TUNA (conductivity mapping)
• Electrochemistry
• Nanoindentation, nanomanipulation and nanoscratching
• PeakForce QNM for mapping simultaneously different kinds of surface properties, from mechanical up to electrical properties
• Capability for both ambient and liquid environments
• The level of oxygen in the glovebox is 0.2%