Atomic Force Microscope
The AFM icon flexible scanner design allows Contact AFM, Tapping mode AFM, Electrostatic Force Microscopy (EFM), Surface Potential AFM, Magnetic Force Microscopy (MFM), Nanomanipulation / nanoscratching and Peak Force QNM application. Stage with full navigation is accommodating samples up to 8'' in diameter and 12mm in thickness
Specifications:
- Contact and Tapping modes AFM
- Magnetic Force Microscopy (MFM)
- Electrostatic force microscopy (EFM) and Surface potential AFM (Kelvin Probe AFM)
- Scanning Spreading Resistance Microscopy (SSRM)
- TUNA (conductivity mapping)
- Electrochemistry
- Nanoindentation, nanomanipulation and nanoscratching
- PeakForce QNM for mapping simultaneously different kind of the surface properties, from mechanical up to electrical properties.
- Temperature control option (-30°C - +100°C)
- Capability for both ambient and liquid environments

- Last modified: 30/05/2016