Material Inspection Services | Surface & Thin Film Characterization – BINA

Material inspection and surface characterization services for nanomaterials, thin films, coatings, and biological samples. 

BINA offers SEM inspection, XRF analysis, optical profiling, ellipsometry, reflectometry, and film thickness measurement. 

Ideal for research in nanomaterials, thin films, biological samples, and coatings.

Our services help you validate, optimize, and troubleshoot with precision. 
Contact us to see how we can support your next step - gr.biunano@biu.ac.il