HR-TEM Service (F200)

עברית

Atomic-resolution TEM imaging,  EDS analysis, electron difraction and cryo holder

Advanced field emission TEM offering high spatial resolution and analytical capabilities for versatile, efficient research.

BINA's Characterization Unit welcomes both industry professionals and researchers – providing state-of-the-art equipment, expert support, and customized solutions. We’re here for you!

Contacts: Dr. Gal Radovsky, gal.radovsky@biu.ac.il

HR-TEM

 

Model:JEM-F200 FEG TEM

Manufacture: JEOL

Description:

Currently in advanced stages of installation, delivers exceptional spatial resolution, analytical performance, and an intuitive operation system. Its design emphasizes versatility and environmental efficiency, supporting a broad range of applications.

Resolution: 0.14 nm (lattice), 0.19 nm (STEM)

                     EDS Mn Kα FWHM = 123.46 eV