SEM FAB

High-quality surface morphology imaging and elemental analysis of conductive and non-conductive materials, supporting morphological and compositional characterization across polymers, nanomaterials, and functional coatings.

Instrument: SEM

Model: JSM-IT210

Manufacturer:  JEOL

Contacts: Belal abu Salha, belal.abu-salha@biu.ac.il

Description : The JEOL JSM-IT210 is a compact, intelligent, InTouchScope™ Scanning Electron Microscope (SEM) designed for user-friendly, automated high-resolution imaging and analysis, featuring a motor-driven 5-axis stage, Simple SEM function for unattended operation, integrated EDS (Energy Dispersive Spectroscopy) for live elemental analysis, and capabilities for low vacuum (LV) mode for non-conductive samples, offering excellent performance for materials science, life science, and industrial QC.