SEM (JSM-IT210)

English

High-quality surface morphology imaging and elemental analysis of conductive and non-conductive materials, supporting morphological and compositional characterization across polymers, nanomaterials, and functional coatings.

BINA's Fabrication Unit welcomes both industry professionals and researchers – providing state-of-the-art equipment, expert support, and customized solutions. We’re here for you!

Contacts: Belal abu Salha, belal.abu-salha@biu.ac.il

Instrument: SEM

Model: JSM-IT210

Manufacturer:  JEOL

Contacts: Belal abu Salha, belal.abu-salha@biu.ac.il

 

Description: The JEOL JSM-IT210 is a compact, intelligent, InTouchScope™ Scanning Electron Microscope (SEM) designed for user-friendly, automated high-resolution imaging and analysis, featuring a motor-driven 5-axis stage, Simple SEM function for unattended operation, integrated EDS (Energy Dispersive Spectroscopy) for live elemental analysis, and capabilities for low vacuum (LV) mode for non-conductive samples, offering excellent performance for materials science, life science, and industrial QC.

Specifications:​

  • Accelerating voltage : 0.3–30 kV​

  • Spatial resolution : 3 nm at 30 kV, 15 nm at 1 kV​

  • Vacuum modes: High-vacuum and low-vacuum operation​

  • Sample compatibility: conductive and non-conductive samples​

  • Detectors: SE and BSE