XRF - X-ray Fluorimeter

English

Thickness of the coatings & composition

X-ray fluorescence analyzer with high-resolution SDD detector for nanoscale coating thickness and trace-level elemental composition analysis.
 
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Contacts: Mr. Mark Oksman, mark.oksman@biu.ac.il

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Model:  MAXXI 6

Manufacture:  Oxford Instruments

Description:

Oxford Instruments MAXXI 6 X-ray Fluorescence (XRF) analyzer for coating thickness and materials analysis. The MAXXI 6 uses a high-resolution SDD detector capable of measuring coatings down to the nanoscale and element composition at trace level.

Specifications:

  • Analyzing solids or liquids over a wide element range from 13Al to 92U

  • Programmable XY stage

  • Easy load feature with prepositioning laser

  • Automated measurement

  • Model for easy calibration

  • Free selection of elements for composition analysis and

  • Free definable layer structure for thickness analysis

  • Micro focus Tungsten (W) tube with Be window
  • 50 kV, 1.2 mA (60 W) rated high voltage generator
  • 25 mm2 SDD detector with Peltier cooling
  • Energy res. 140 eV (FWHM for MnKα)
  • Programmable collimator set including 8 collimators from 0.05 mm to 1mm diameter