יצירת קשר עם אחראי ציוד

Contact Person

Instrument 

Characterization

Dr. Olga Girshevitz, olga.girshevitz@biu.ac.il;

Dr. Eti Teblum, eti.teblum@biu.ac.il

Atomic Force Microscope (AFM)

Ms. Lior Giterman, lior.hefetz-giterman@biu.ac.il;

Ms. Helena Sabanay, helena.sabanay@biu.ac.il

Biological Sample Preparation

Dr. Nataliia Dudchenko, natalia.dudchenko@biu.ac.il

Contact Angle Measurement

Ms. Lior Giterman, lior.hefetz-giterman@biu.ac.il;

Ms. Helena Sabanay, helena.sabanay@biu.ac.il

Cryo TEM

Dr. Sasha Domantovsky, alexander.domantovsky@biu.ac.il

Focused Ion Beam (FIB)

Dr. Yulia Vestfrid, yulia.vestfrid@biu.ac.il

High-Resolution SEM (HR-SEM)

Dr. Gal Radovsky, gal.radovsky@biu.ac.il

High-Resolution TEM (HR-TEM)

Dr. Olga Girshevitz, olga.girshevitz@biu.ac.il

Ion Beam Analysis (IBA)

Mr. Nahum Shabi, nahum.shabi@biu.ac.il

Raman Spectroscopy

Dr. Yulia Vestfrid, yulia.vestfrid@biu.ac.il

SEM (SEM)

Dr. Gili Cohen-Taguri, gili.cohen-taguri@biu.ac.il

X-Ray Diffraction (XRD)
  
  

Fabrication

Mr. Mark Oksman, mark.oksman@biu.ac.il

Dicing Saw

Mr. Mark Oksman, mark.oksman@biu.ac.il

Dry Etch ICP-RIE

Mr. Mark Oksman, mark.oksman@biu.ac.il

e-Beam Evaporation

Dr. Olga Girshevitz, olga.girshevitz@biu.ac.il

Mr. Mark Oksman, mark.oksman@biu.ac.il

e-Beam Lithography

Mr. Mark Oksman, mark.oksman@biu.ac.il

High-Resolution Laser Lithography

Dr. Olga Girshevitz, olga.girshevitz@biu.ac.il

Ion Beam Sputtering

Mr. Mark Oksman, mark.oksman@biu.ac.il

Mask Aligner

Mr. Mark Oksman, mark.oksman@biu.ac.il

Maskless Laser Lithography

Mr. Moshe Feldberg, moshe.feldberg@biu.ac.il

PVD

Mr. Mark Oksman, mark.oksman@biu.ac.il

SEM

Mr. Mark Oksman, mark.oksman@biu.ac.il

Spectroscopic Ellipsometer

Dr. Eti Teblum, eti.teblum@biu.ac.il

Spectroscopic Reflectometer

Mr. Moshe Feldberg, moshe.feldberg@biu.ac.il

Stylus Profiler

Mr. Erel Lasnoy, erel.lasnoy@biu.ac.il;

Mr. Moshe Feldberg, moshe.feldberg@biu.ac.il

Ultra High-Resolution 3D Printer

Mr. Mark Oksman, mark.oksman@biu.ac.il

Wafer Bonder

Mr. Mark Oksman, mark.oksman@biu.ac.il

XRF - X-ray Fluorimeter

Mr. Mark Oksman, mark.oksman@biu.ac.il

3D Optical Profiler