X-ray Fluorescence (XRF)

English

Contamination/foreign-particle analysis, coating thickness & uniformity, inclusion/defect detection, compositional mapping.

Non-destructive, high-sensitivity XRF with micron-scale elemental mapping. supports both qualitative and quantitative analysis with no sample prep. sensitivity to light elements (Na–Ca). ideal for surface/near-surface characterization.

BINA's Characterization Unit welcomes both industry professionals and researchers – providing state-of-the-art equipment, expert support, and customized solutions. We’re here for you!

Contacts: Dr. Belal Abu Salha, belal.abu-salha@biu.ac.il

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Model: XGT-7200

Manufacturer: Horiba

Specifications: 

  • Microprobe beam down to 10 µm

  • fast scans over areas up to 10 × 10 cm

  • Wide elemental range (Na–U)

  • Shallow analysis depth (few µm)