Particle Induced X-Ray Emission Analysis (PIXE)

• Nondestructive and multielemental analysis of trace elements with an excellent detection limit of up to 20 ppb
• Used together with RBS for accurate mass identification of medium to heavy elements with similar masses
• Elemental composition of magnetic films in which RBS does not have an enough mass resolution to resolve Mn-Fe-Co-Ni elements
• Channeling-PIXE can be used to determine lattice location of impurities in single crystalline samples

Specifications:

Fast X123 SDD70 (C2) detector (Amptek, Bedford, MA, USA) X-ray detector and X-123 - CdTe detector with 4.0 mil Be for particle induced X-ray emission (PIXE) analysis of trace elements for broad range of energies