What's New - Coming Soon

BINA is proud to partner with JEOL, the leading manufacturer of electron microscopes, as a Beta site for their next-generation equipment. Three state-of-the-art electron microscopes will be added to the Characterization Unit MIXA, offering advanced research capabilities across various fields.

The "NEOARM" / JEM-ARM200F features JEOL’s Cold Field Emission Gun (Cold FEG) and advanced aberration correction technology, enabling atomic-resolution imaging at both high and low voltages. Enhanced contrast for light elements is achieved through a novel STEM imaging technique (e-ABF), making it ideal for studying light-element materials.

The JEM-1400Flash caters to diverse research areas, including biology, nanotechnology, and materials science. Equipped with a high-sensitivity sCMOS camera, ultra-wide area montage system, and optical microscope image linkage, it simplifies workflows and provides high-throughput imaging for detailed structural analysis.

SKYSCAN 2214 CMOS is a compact 3D X-Ray Microscope provides 500 nm spatial resolution, down to 60 nm pixel size and allows scanning objects up to  140 mm diameter and 130 mm length. The multiscale X-ray nanotomograph  covers the widest range of object sizes and spatial resolutions in a single instrument. It opens unique possibilities for 3D imaging and exact modeling of all types of biological samples, including mineralized tissues, soft tissues, plants, insects, paleontological samples, etc.   

Those cutting-edge equipment's renewal positions BINA at the forefront of scientific exploration and innovation.

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