What's New - Coming Soon in Characterization

BINA is proud to partner with JEOL, the leading manufacturer of electron microscopes, as a Beta site for their next-generation equipment. Three state-of-the-art electron microscopes will be added to the Characterization Unit MIXA, offering advanced research capabilities across various fields.

The "NEOARM" / JEM-ARM200F features JEOL’s Cold Field Emission Gun (Cold FEG) and advanced aberration correction technology, enabling atomic-resolution imaging at both high and low voltages. Enhanced contrast for light elements is achieved through a novel STEM imaging technique (e-ABF), making it ideal for studying light-element materials.

SKYSCAN 2214 CMOS is a compact 3D X-Ray Microscope provides 500 nm spatial resolution, down to 60 nm pixel size and allows scanning objects up to  140 mm diameter and 130 mm length. The multiscale X-ray nanotomograph  covers the widest range of object sizes and spatial resolutions in a single instrument. It opens unique possibilities for 3D imaging and exact modeling of all types of biological samples, including mineralized tissues, soft tissues, plants, insects, paleontological samples, etc.   

Cary 60 UV-Vis Spectrophotometer

The Cary 60 UV-Vis spectrophotometer employs a double-beam design and a high-intensity xenon flash lamp (80 Hz), which is activated only during data acquisition to minimize photodegradation and energy consumption. Its tightly focused beam ensures accurate, reproducible results, even with small sample volumes.

Those cutting-edge equipment's renewal positions BINA at the forefront of scientific exploration and innovation.

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