Stylus Profiler Service
Thickness analysis
Benchtop stylus profilometer with 4Å repeatability and enhanced scanning speed. Ideal for surface height and roughness measurements.
BINA's Fabrication Unit welcomes both industry professionals and researchers – providing state-of-the-art equipment, expert support, and customized solutions. We’re here for you!
Contacts: Mr. Moshe Feldberg, moshe.feldberg@biu.ac.il
Model: DektakXT
Manufacture: Bruker
Description: The DektakXT® stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4Å and up to 40% improvement in scanning speeds.
Specifications:
- Scan length: from 50 µm to 50 mm
- 2.5 μm tip radius
- 0.03-15 mg variable stylus force
- Minimum step height: 5 nm
- Maximum step height: 1 mm
- Vertical repeatability = 4Å on 0.1 um step
- Max sample thickness: 50 mm / max sample diameter: 8"
