X-Ray Diffraction (XRD)

Crystallography & Stress anlysis

Versatile high-resolution diffractometer for advanced XRD analysis of powders, polymers, thin films, and bulk materials.

BINA's Characterization Unit welcomes both industry professionals and researchers – providing state-of-the-art equipment, expert support, and customized solutions. We’re here for you!

Contacts: Dr. Gili Cohen-Taguri, gili.cohen-taguri@biu.ac.il

XRD

Model: Rigaku Smartlab, a high flux 9 kW

Manufacture: Rigaku Corporation, Japan

Specifications:

  • High power 9 kW rotating anode (Cu target).
  • Five-axis high-resolution goniometer equipped with X-Y-Z mapping and Rx–Ry sample stages.
  • 3-channel cut monochromators: Ge(220) 2-bounce and 4-bounce, Ge (400) 2-bounce, and a Ge (220) 2-bounce analyzer, facilitating medium and high-resolution XRD and XRR measurements.
  • Micro-focus Optics Unit CBO-f: enhances spatial resolution for small feature analysis and improves performance for XRD measurement of small specimens, ranging from 400µm to 100µm (utilizing a collimator).
  • Two detectors for increased versatility and speed: a point scintillator and a 1D D/teX Ultra high-speed silicon strip detector.