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Charged-Particle Microscopy
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Dual Beam (FIB), Helios 5UC
Analytical TEM
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Ultra Microtome, EM UC7
Surface Analysis
Atomic Force Microscopy Lab
AFM Icon
AFM MultiMode V
Dimension FastScan Bio
IBA
ERDA
Ion channeling analysis
NRA
PIXE
RBS
Ion Implanter
XRD
Contact Angle Measuring and contour analysis Instrument
Nano Fabrication
Clean Rooms Facility
E-Beam Lithography
ICP/RIE
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Thin Layer Deposition
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Last Updated Date : 30/09/2021
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