Atomic Force Microscopy (AFM)
Surface 3D imaging & property analysis
High-resolution surface imaging and characterization of topography and physical properties using a scanning probe. Operates under various environmental conditions.
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Contacts: Dr. Olga Girshevitz, olga.girshevitz@biu.ac.il
Dr. Eti Teblum, eti.teblum@biu.ac.il
Model: MultiMode NanoscopeV, ICON, Bio FastScan AFM
Manufacturer: Bruker, AXS
Description:
Atomic Force Microscopy (AFM) is a technique that utilizes a fine probe to physically scan across a surface, measuring not only topography but also electrical, mechanical, and magnetic properties at resolutions that can reach the atomic level. The AFM can be operated in various ambient conditions, including air, liquid, and vacuum.
Atomic Force Microscopy (AFM) offers the capability to image surface topography regardless of sample conductivity.
