HR-SEM, Magellan 400L

עברית

XHR-SEM –High Resolution Scanning Electron Microscope, FEI, Magellan 400Lis used for morphology and topography analysis at resolutions down to 0.6nm. 

Specifications
  • Field Emission Gun (Schottky field emitter UC (UniCore))
  • High vacuum
  • Detectors: TLD, Vcd, SE, EDS, EBSD, STEM
  • Resolution 0.6nm
High Resolution Scanning Electron Microscope

 

 

Last Updated Date : 30/12/2021