High Resolution Scanning Electron Microscope
XHR-SEM –High Resolution Scanning Electron Microscope, FEI, Magellan 400Lis used for morphology and topography analysis at resolutions down to 0.6nm.
Specifications:
- Field Emission Gun (Schottky field emitter UC (UniCore))
- High vacuum
- Detectors: TLD, Vcd, SE, EDS, EBSD, STEM
- Resolution 0.6nm

- Last modified: 15/10/2018