High Resolution Scanning Electron Microscope

XHR-SEM –High Resolution Scanning Electron Microscope, FEI, Magellan 400Lis used for morphology and topography analysis at resolutions down to 0.6nm. 

Specifications: 
  • Field Emission Gun (Schottky field emitter UC (UniCore))
  • High vacuum
  • Detectors: TLD, Vcd, SE, EDS, EBSD, STEM
  • Resolution 0.6nm

 

 

Book your order for HR-SEM measurements

 

  • Last modified: 8/06/2016