HR-SEM
Contacts: Dr. Anat Itzhak, anatitzhak2@gmail.com
Dr. Yuila Vestrfid, Yulia.vestfred@biu.ac.il
Model: Magellan 400L
Manufacture: FEI
Description:
A high-resolution micrograph is used to study morphology with secondary electron detectors and has the ability to perform elemental analysis through Energy-dispersive X-ray spectroscopy (EDS) and Backscattering Electron (BSE) detectors, including mapping and elemental distribution.
Resolution: 0.6 nm
Last Updated Date : 04/04/2024