HR-SEM

Contacts: Dr. Itzhak Anat,  anatitzhak2@gmail.com

                   Dr. Vestrfid Yuila, Yulia.vestfred@biu.ac.il

 

Model: Magellan 400L

Manufacture: FEI

Description:

A high-resolution micrograph is used to study morphology with secondary electron detectors and has the ability to perform elemental analysis through Energy-dispersive X-ray spectroscopy (EDS) and Backscattering Electron (BSE) detectors, including mapping and elemental distribution.

Resolution: 0.6 nm

 

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High Resolution Scanning Electron Microscope

 

 

 

תאריך עדכון אחרון : 14/02/2024