HR-SEM
Contacts: Dr. Itzhak Anat, anatitzhak2@gmail.com
Dr. Vestrfid Yuila, Yulia.vestfred@biu.ac.il
Model: Magellan 400L
Manufacture: FEI
Description:
A high-resolution micrograph is used to study morphology with secondary electron detectors and has the ability to perform elemental analysis through Energy-dispersive X-ray spectroscopy (EDS) and Backscattering Electron (BSE) detectors, including mapping and elemental distribution.
Resolution: 0.6 nm
![High Resolution Scanning Electron Microscope](/sites/nano/files/styles/large/public/images/instrument/HRSEM.png?itok=1Kcf6Ifi)
תאריך עדכון אחרון : 16/05/2024