HR-SEM

Contacts: Dr. Vestrfid Yuila, yulia.vestfrid@biu.ac.il

Model: Magellan 400L

Manufacture: FEI

Description:

A high-resolution micrograph is used to study morphology with secondary electron detectors and has the ability to perform elemental analysis through Energy-dispersive X-ray spectroscopy (EDS) and Backscattering Electron (BSE) detectors, including mapping and elemental distribution.

Resolution: 0.6 nm

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