Contacts: Dr. Itzhak Anat,

                   Dr. Vestrfid Yuila,


Model: Magellan 400L

Manufacture: FEI


A high-resolution micrograph is used to study morphology with secondary electron detectors and has the ability to perform elemental analysis through Energy-dispersive X-ray spectroscopy (EDS) and Backscattering Electron (BSE) detectors, including mapping and elemental distribution.

Resolution: 0.6 nm


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High Resolution Scanning Electron Microscope




תאריך עדכון אחרון : 16/05/2024