E- SEM | המכון לננו טכנולוגיה וחומרים מתקדמים

Contacts: Dr. Vestrfid Yuila, yulia.vestfrid@biu.ac.il

Model: Quanta FEG 250

Manufacture: FEI

Description:

ESEM is using for morphology and topography analysis. The uniqueness of the E-SEM is the ability to perform the measurement under humid and low vacuum conditions in addition to the standard high vacuum conditions.

Resolution: 3 nm