Spectroscopic Reflectometer
Contacts: Yossi Abulafia, yossi.abulafia@biu.ac.il
Model: NanoCalc
Manufacture: Ocean
Description:
The NanoCalc Thin Film Reflectometry System allows to analyze the thickness of optical layers from 1 nm to 250 µm .
![Spectroscopic Reflectometer](/sites/nano/files/styles/large/public/images/instrument/NANO%20CALC.png?itok=UyQlqMuB)
תאריך עדכון אחרון : 15/02/2024