Spectroscopic Reflectometer
Thin film metrology
Thin film reflectometry system for measuring optical layer thickness (1 nm to 250 µm) and analyzing transmission/reflection in 230-1100 nm range.
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Contacts: Dr. Eti Teblum, eti.teblum@biu.ac.il
Model: NanoCalc Optics
Manufacture: Ocean
Description:
The NanoCalc Thin Film Reflectometry System allows researchers to analyze the thickness of optical layers from 1 nm to 250 µm and to measure light transmission and reflection in the range of 230 – 1100 nm.
Specifications:
- Thickness resolution of 0.1 nm
- 3 kinds of probes (standalone probe, microscope probe for microstructures measurements and transmission
- single-layer or multilayer films
- Wavelength range 230-1100nm
Last Updated Date : 25/06/2025
