Woollam Spectroscopic Ellipsometer
Contacts: Mark Oksman, mark.oksman@biu.ac.il
Model: Woollam M-2000
Manufacture: Woollam
Description:
Woollam M-2000 is a spectroscopic ellipsometer capable of extracting thickness and index of refraction for transparent and semi-transparent thin films or coatings. It is equipped with fully automated sample alignment with stage tip/tilt and focus. It has a high speed CCD detector for collection of data across the full spectral range of 193-1683 nm simultaneously. Typical acquisition time is 5 sec per site per angle.
![Woollam Spectroscopic Ellipsometer](/sites/nano/files/styles/large/public/images/instrument/m2000-ellipsometer.jpg?itok=59Yv4nR-)
תאריך עדכון אחרון : 15/02/2024