Spectroscopic Ellipsometer

Contacts: Mr. Mark Oksman, mark.oksman@biu.ac.il

Model:  Woollam M-2000 XI

Manufacture:  Woollam

Description:

Woollam M-2000 is a spectroscopic ellipsometer capable of extracting thickness and index of refraction for transparent and semi-transparent thin films or coatings. It is equipped with fully automated sample alignment with stage tip/tilt and focus. It has a high-speed CCD detector for collection of data across the full spectral range of 245 – 1690 nm simultaneously. Typical acquisition time is 5 sec per site per angle.

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