Woollam Spectroscopic Ellipsometer

Contacts: Mr. Mark Oksman, mark.oksman@biu.ac.il


Model:  Woollam M-2000

Manufacture:  Woollam


Woollam M-2000 is a spectroscopic ellipsometer capable of extracting thickness and index of refraction for transparent and semi-transparent thin films or coatings. It is equipped with fully automated sample alignment with stage tip/tilt and focus. It has a high-speed CCD detector for collection of data across the full spectral range of 193-1683 nm simultaneously. Typical acquisition time is 5 sec per site per angle.


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Woollam Spectroscopic Ellipsometer

Last Updated Date : 07/04/2024