Spectroscopic Ellipsometer
Refractive index & thickness
High-speed ellipsometer for measuring thickness and refractive index of thin films. Covers 245-1690 nm spectrum with automated sample alignment.
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Contacts: Mr. Mark Oksman, mark.oksman@biu.ac.il
Model: Woollam M-2000 XI
Manufacture: Woollam
Description:
Woollam M-2000 is a spectroscopic ellipsometer capable of extracting thickness and index of refraction for transparent and semi-transparent thin films or coatings. It is equipped with fully automated sample alignment with stage tip/tilt and focus. It has a high-speed CCD detector for collection of data across the full spectral range of 245 – 1690 nm simultaneously. Typical acquisition time is 5 sec per site per angle.
Specifications:
- Wavelength range 245 – 1690 nm
- Focusing probs – spot size ~50 μm
- Automatic surface mapping and variable angle measurement
Last Updated Date : 25/06/2025
