High-Resolution TEM (HR-TEM)

Atomic-resolution TEM imaging & EDS analysis & electron difraction & cryo holder

Advanced field emission TEM offering high spatial resolution and analytical capabilities for versatile, efficient research.

BINA's Characterization Unit welcomes both industry professionals and researchers – providing state-of-the-art equipment, expert support, and customized solutions. We’re here for you!

Contacts: Dr. Gal Radovsky, gal.radovsky@biu.ac.il

Model:JEM-F200 FEG TEM

Manufacture: JEOL

Description: 

Currently in advanced stages of installation, delivers exceptional spatial resolution, analytical performance, and an intuitive operation system. Its design emphasizes versatility and environmental efficiency, supporting a broad range of applications.

Resolution: 0.14 nm (lattice), 0.19 nm (STEM)

                      EDS Mn Kα FWHM = 123.46 eV