HR-TEM JemF200

Contacts: Dr. Gal Radovsky, gal.radovsky@biu.ac.il

Model: JEM-F200 Field Emission Gun TEM

Manufacture: JEOL

Description: 

Currently in advanced stages of installation, delivers exceptional spatial resolution, analytical performance, and an intuitive operation system. Its design emphasizes versatility and environmental efficiency, supporting a broad range of applications.

Resolution: 0.14 nm (lattice), 0.19 nm (STEM)

                      EDS Mn Kα FWHM = 123.46 eV