Atomic Force Microscopy (AFM)

Contacts: Dr. Olga Girshevitz,

                   Dr. Eti Teblum,



MultiMode NanoscopeV


Bio FastScan AFM

Manufacturer: Bruker, AXS, Santa-Barbara, USA


Atomic Force Microscopy (AFM) is a technique that utilizes a fine probe to physically scan across a surface, measuring not only topography but also electrical, mechanical, and magnetic properties at resolutions that can reach the atomic level. The AFM can be operated in various ambient conditions, including air, liquid, and vacuum.

Atomic Force Microscopy (AFM) offers the capability to image surface topography regardless of sample conductivity.


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Last Updated Date : 09/05/2024