Ion Beam Analysis (IBA)

Elemental & isotopic profiling, thickness measurements

High-energy ion beam accelerator for elemental and isotopic analysis using techniques such as RBS, ERDA, PIXE, NRA, and ion channeling. Offers ppm sensitivity and nm depth resolution.

BINA's Characterization Unit welcomes both industry professionals and researchers – providing state-of-the-art equipment, expert support, and customized solutions. We’re here for you!

Contacts: Dr. Olga Girshevitz, olga.girshevitz@biu.ac.il

Model: 1.7 MV tandem Pelletron, model 5SDH

Manufacture: NEC, USA

Description:

High-energy ion beam accelerator for elemental and isotopic analysis using techniques such as RBS, ERDA, PIXE, NRA, and ion channeling. Offers ppm sensitivity and nm depth resolution.

Applications:

• Rutherford Backscattering Spectroscopy (RBS)
• Elastic Recoil Detection Analysis (ERDA)
• Particle Induced X-Ray Emission (PIXE)
• Nuclear Reaction Analysis (NRA)
• Ion Channeling

Specifications:

• The 1.7 MV tandem Pelletron produces beams of protons or alpha particles at energies up to 3.4 MeV for protons or 5.1 MeV for alpha particles at currents up to 100 nA
• Analytical endstation (RBS 400) and control software (HYPRA) by Charles Evans & Associates

Sample Requirements:

• Sample size from 10mm x 10mm up to 25mm x 75mm
• Powder samples can be analyzed
• Both conducting and isolating samples can be analyzed

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