HR-TEM

Contacts: Dr. Radovsky Gal, gal.radovsky@biu.ac.il

Model: JEM2100

Manufacture: JEOL

Description:

TEM uses electrons accelerated by a high voltage at the range of 60-300KV. In analogy to the light microscopy, electrons can be used to form a magnified image. The short de-Broglie wavelength of the electrons which is of the order of 10^-12 nm, makes atomic lattice observation possible.

Resolution: 0.23 nm (point to point), 0.14 nm (lattice)

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