יחידת אפיון

ראש יחידת אפיון, MIXA: דרץ אולגה גירשביץ: olga.girshevitz@biu.ac.il

 

At the heart of the Nano center, our Characterization Unit (Microscopy, Ion Beam Analysis, X-ray Diffraction, and Atomic Force Microscopy, MIXA) is dedicated to advancing cutting-edge research through state-of-the-art analytical techniques. Our mission is to provide researchers with unparalleled access to a diverse range of tools, enabling in-depth investigations into nanomaterials and biological samples. We aim to be a hub for precision analysis, driving advancements in nanoscience and technology, fostering interdisciplinary collaborations, and contributing to groundbreaking discoveries.

תאריך עדכון אחרון : 19/02/2024