Stylus Profiler

Thickness analysis

Benchtop stylus profilometer with 4Å repeatability and enhanced scanning speed. Ideal for surface height and roughness measurements.

BINA's Fabrication Unit welcomes both industry professionals and researchers – providing state-of-the-art equipment, expert support, and customized solutions. We’re here for you!
 

Contacts: Mr. Moshe Feldberg, moshe.feldberg@biu.ac.il

 

Model:  DektakXT

Manufacture:  Bruker

Description: The DektakXT® stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4Å and up to 40% improvement in scanning speeds.

Specifications:

  • Scan length: from 50 µm to 50 mm
  • 2.5 μm tip radius
  • 0.03-15 mg variable stylus force
  • Minimum step height: 5 nm
  • Maximum step height: 1 mm
  • Vertical repeatability = 4Å on 0.1 um step
  • Max sample thickness: 50 mm / max sample diameter: 8"
Stylus Profiler

Last Updated Date : 25/06/2025