Stylus Profiler
Thickness analysis
Benchtop stylus profilometer with 4Å repeatability and enhanced scanning speed. Ideal for surface height and roughness measurements.
BINA's Fabrication Unit welcomes both industry professionals and researchers – providing state-of-the-art equipment, expert support, and customized solutions. We’re here for you!
Contacts: Mr. Moshe Feldberg, moshe.feldberg@biu.ac.il
Model: DektakXT
Manufacture: Bruker
Description: The DektakXT® stylus profilometer features a revolutionary benchtop design that enables an unmatched repeatability of 4Å and up to 40% improvement in scanning speeds.
Specifications:
- Scan length: from 50 µm to 50 mm
- 2.5 μm tip radius
- 0.03-15 mg variable stylus force
- Minimum step height: 5 nm
- Maximum step height: 1 mm
- Vertical repeatability = 4Å on 0.1 um step
- Max sample thickness: 50 mm / max sample diameter: 8"

Last Updated Date : 25/06/2025