X-Ray Diffraction (XRD)

Nano-imaging, elemental composition analysis & high presicion milling, deposition at the nano and micro-scales

Dual-beam system combining SEM and FIB for high-resolution imaging, cross-sectioning, material analysis, and 3D reconstruction. Ideal for TEM sample prep, device modification, failure analysis, and tomography. Includes EDX and cryo-stage.

BINA's Characterization Unit welcomes both industry professionals and researchers – providing state-of-the-art equipment, expert support, and customized solutions. We’re here for you!

Contacts: Dr. Gili Cohen-Taguri, gili.cohen-taguri@biu.ac.il

Model: Rigaku Smartlab, a high flux 9 kW

Manufacture: Rigaku Corporation, Japan

Description:

Versatile high-resolution diffractometer for advanced XRD analysis of powders, polymers, thin films, and bulk materials.

Specifications:

• High power 9 kW rotating anode (Cu target).
• Five-axis high-resolution goniometer equipped with X-Y-Z mapping and Rx–Ry sample stages.
• 3-channel cut monochromators: Ge(220) 2-bounce and 4-bounce, Ge (400) 2-bounce, and a Ge (220) 2-bounce analyzer, facilitating medium and high-resolution XRD and XRR measurements.
• Micro-focus Optics Unit CBO-f: enhances spatial resolution for small feature analysis and improves performance for XRD measurement of small specimens, ranging from 400µm to 100µm (utilizing a collimator).
• Two detectors for increased versatility and speed: a point scintillator and a 1D D/teX Ultra high-speed silicon strip detector.