XRF - X-ray Fluorimeter
Thickness of the coatings & composition
X-ray fluorescence analyzer with high-resolution SDD detector for nanoscale coating thickness and trace-level elemental composition analysis.
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Contacts: Mr. Mark Oksman, mark.oksman@biu.ac.il
Model: MAXXI 6
Manufacture: Oxford Instruments
Description:
Oxford Instruments MAXXI 6 X-ray Fluorescence (XRF) analyzer for coating thickness and materials analysis. The MAXXI 6 uses a high-resolution SDD detector capable of measuring coatings down to the nanoscale and element composition at trace level.
Specifications:
- Analyzing solids or liquids over a wide element range from 13Al to 92U
- Programmable XY stage
- Easy load feature with prepositioning laser
- Automated measurement
- Model for easy calibration
- Free selection of elements for composition analysis and
- Free definable layer structure for thickness analysis
- Micro focus Tungsten (W) tube with Be window
- 50 kV, 1.2 mA (60 W) rated high voltage generator
- 25 mm2 SDD detector with Peltier cooling
- Energy res. 140 eV (FWHM for MnKα)
- Programmable collimator set including 8 collimators from 0.05 mm to 1mm diameter
Last Updated Date : 01/07/2025
