TEM

Contacts: Ms. Lichtenstein-Wolfheim Rotem, rotem.lichtenstein-wolfheim@biu.ac.il

Model: JEM-1400

Manufacture: JEOL

Description:

Transmission electron microscopy (TEM) is a technique used to observe the features of very small specimens. The technology uses an accelerated beam of electrons, which passes through a very thin specimen to enable a scientist the observe features such as structure and morphology.

Resolution: 0.38nm (point to point), 0.2nm (lattice)

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