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Charged-Particle Microscopy
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Analytical TEM
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Ultra Microtome, EM UC7
Surface Analysis
Atomic Force Microscopy Lab
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AFM MultiMode V
Dimension FastScan Bio
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ERDA
Ion channeling analysis
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Ion Implanter
XRD
Contact Angle Measuring and contour analysis Instrument
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Clean Rooms Facility
E-Beam Lithography
ICP/RIE
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Photo Lithography
Thin Layer Deposition
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NanoEl
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Last Updated Date : 16/12/2021
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