Electronic properties of low dimensional systems

• Thin film growth: Thermal evaporation, e-beam evaporation UHV techniques and quench- condensation methods.
• Advanced Lithography: Electron beam nano-lithography and Photo-lithography, ion milling, reactive ion milling, chemical etching and other processing techniques applicable to sub-micron electronics.
• Microscopy: Scanning and transmission electron microscopy, scanning tunneling microscopy (STM) and atomic force microscopy (AFM).
• Low Temperature: Cryogenic measurement techniques, low noise measurements, dc and ac (lock-in) techniques, high field magneto-transport measurements.