X-ray-pulse characterization by spectral shearing interferometry using three-wave mixing

We describe a method for measuring the field profile of x-ray ultrashort pulses including phase information. The scheme is based on spectrally interfering two replicas of the same pulse, which are spectrally shifted via three-wave mixing with IR or visible beams. Using a single-shot spectrometer the scheme can be used for the inspection of individual ultrashort x-ray pulses with random amplitudes and phases. Examples for characterization of stochastic pulses with a bandwidth of 1 eV are given, including criteria for a successful measurement.