Scaling of the anomalous Hall effect in SrRuO(3)

We measure the anomalous Hall effect (AHE) resistivity rho(xy) in thin films of the itinerant ferromagnet SrRuO(3). At low temperatures, the AHE coefficient R(s) varies with rho(2)(xx), and at higher temperatures, R(s) reaches a peak and then changes sign just below T(c). We find that for all films studied, R(s) scales with resistivity in the entire ferromagnetic phase. We attribute the observed behavior to the contribution of the extrinsic side-jumps mechanism and the intrinsic Karplus-Luttinger (Berry phase) mechanism, including the effect of finite scattering rates.