BINA's Magnetic Measurements Facility offers comprehensive magnetic characterization, including information about electrical properties, heat capacity, and magnetization. It provides magnetic imaging capabilities over a wide range of temperatures. The facility is equipped with a Magnetic Force Microscope (MFM) – a fully operating Atomic Force Microscope (AFM) capable of working in high magnetic fields (up to 8 Tesla), a wide range of temperatures (2K to 400K), and high vacuum. The MFM is used to study magnetic, electronic and morphologic properties of surfaces and devices, with nanometric resolution.