Transmission Electron Microscope

The Transmission Electron Microscope, JEM-1400, JEOL is an Analytical TEM being used for 2D imaging of various samples from the field of Materials Science as well as from Life Science.  

מפרטים: 
  • Accelerating voltage 120 kV
  • Bottom CCD 2x2k camera
  • Specimen tilt +/-70°
  • Detectors: BF/DF, STEM, EDS (UltraDry SDD)
  • STEM image resolution 2.0nm
  • Resolution 0.38nm (point to point), 0.2nm (lattice)