Scanning Electron Microscope

Scanning electron microscope, Inspect, FEI is using for morphology and topography analysis as well as for elemental analysis by EDS. EDS mapping and line scanning are available as well in Inspect model. 

מפרטים: 
  • Low/High vacuum
  • Detectors: SE, BSED, EDS, mapping and line scanning
  • Resolution 3.3nm
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