Spectroscopic Imaging Ellipsometer

    

Specifications: 

Three in one – imaging ellipsometery, Brewster angle microscopy and imaging SPR with one instrument

  • Imaging of thin layers on liquid surfaces
  • Thickness of films (single/multiple layers)
  • Optical properties of each layer
  • Modeling of surface roughness
  • Micro-Mapping for high-resolution maps of Δ / ψ thickness, refractive index, etc
  • Resolution – 2mm (lateral) < 0.10nm (Z)
  • Travel Range – 100 mm x 100 mm x 12mm
  • 768 x 572 pixel CCD camera