Transmission Electron Microscope
The Transmission Electron Microscope, JEM-1400, JEOL is an Analytical TEM being used for 2D imaging of various samples from the field of Materials Science as well as from Life Science.
- Accelerating voltage 120 kV
- Bottom CCD 2x2k camera
- Specimen tilt +/-70°
- Detectors: BF/DF, STEM, EDS (UltraDry SDD)
- STEM image resolution 2.0nm
- Resolution 0.38nm (point to point), 0.2nm (lattice)