Atomic Force Microscope

The AFM icon flexible scanner design allows Contact AFM, Tapping mode AFM, Electrostatic Force Microscopy (EFM), Surface Potential AFM, Magnetic Force Microscopy (MFM), Nanomanipulation / nanoscratching and Peak Force QNM application. Stage with full navigation is accommodating samples up to 8'' in diameter and 12mm in thickness 

Specifications: 
  • Contact and Tapping modes AFM
  • Magnetic Force Microscopy (MFM)
  • Electrostatic force microscopy (EFM) and Surface potential AFM (Kelvin Probe AFM)
  • Scanning Spreading Resistance Microscopy (SSRM)
  • TUNA (conductivity mapping)
  • Electrochemistry
  • Nanoindentation, nanomanipulation and nanoscratching
  • PeakForce QNM for mapping simultaneously different kind of the surface properties, from mechanical up to electrical properties.
  • Temperature control option (-30°C - +100°C)
  • Capability for both ambient and liquid environments
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